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Hindi Research Article, J Nanomater Mol Nanotechnol Vol: 3 Issue: 2
Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites
| Eed H1* and Zihlif AM2 | |
| 1Basic Science Department, Applied Science Private University, Jordan | |
| 2Physics Department, the University of Jordan, Amman, Jordan | |
| Corresponding author : Dr. Eed H Basic Science Department, Applied Science Private University, Jordan E-mail: eed.hussam@yahoo.com |
|
| Received: January 27, 2014 Accepted: March 13, 2014 Published: March 17, 2014 | |
| Citation: Eed H, Zihlif AM (2014) Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites. J Nanomater Mol Nanotechnol 3:2. doi:10.4172/2324-8777.1000144 |
Abstract
Characteristics of Dielectric Dispersion in Epoxy/Polyhedral Oligomeric Silsequioxane Nanocomposites
Multiple-arc analysis is used in conjunction with a generalized relaxation time distribution (GRTD) to derive dielectric constant, dielectric loss and a.c conductivity relations as function of frequency for epoxy/ polyhedral oligomericsilsequioxane (POSS) nanocomposites. The validity of this methodology is examined by comparing reported measurements with those calculated from relations obtained. The values are shown to agree satisfactorily over the frequency range 100kHz to 1000kHz.
