Classic and Topologic Dimensional Effects in SnO2 Thin Films Detected by Surface Plasmon Resonance Technique

Classic and Topologic Dimensional Effects in SnO₂ Thin Films Detected by Surface Plasmon Resonance Technique

Internal reflection features caused by the surface plasmon resonance in nanoscale films containing defect tin dioxide clusters in the stoichiometric dielectric matrix are studied by means of polarization modulation of electromagnetic radiation. The angular and spectral characteristics of reflectances R_s² and R_ρ² of s- and p-polarized radiation and their polarization difference ρ=R_s²–R_ρ² are measured in the wavelength range λ=400-1600 nm. The obtained experimental characteristics ρ(θ, λ) (θ is the radiation incidence angle) represent the optical property features associated with the film structure and morphology. Surface plasmon polaritons and local plasmons excited by s- and p-polarized radiation are detected; their frequency and relaxation properties are determined. The technique employed for studying surface plasmon resonance in tin dioxide films is appeared to be structurally sensitive.